Microelectronics and Semiconductor

Aiding materials researchers and engineers involved in microelectronics in developing new solutions, improving processes, and reducing materials and production costs.

Today’s microelectronic and semiconductor devices represent some of the most complex materials problems. As the scale on which these devices are fabricated continues to diminish and the breadth of elements and compounds utilized continues to expand, the challenge they present to the materials engineer increases dramatically. No single analytical technique can be expected to comprehensively answer all the materials support questions that arise from this exciting industry. The diversity of the Thermo Scientific* materials characterization portfolio allows materials engineers in this industry to meet today’s challenges and to discover future fabrication opportunities.

Acids

Providing the detection power required for elemental quantification of trace metals in high purity mineral acids.

Products  

 

Hard Disk Drives

Reliable and precise coating thickness determination, multi-layer analysis, defect analysis and process control of materials used in hard disk drives.

Products  

 

Ammonia Solution

Offering elemental quantification of trace metals in high purity ammonia solution.

Products  

 

LCD

Enabling the elemental quantification of ultra-trace metals in liquid crystals for LCD displays, and microspectroscopies in analysis of materials and structural characterization of LCD displays.

Products  

 

Deposition

Facilitating the elemental quantification of trace metals in high purity semiconductor samples.

Products  

 

OLED

Techniques in the characterization and understanding of polymer based electronics that form the basis of OLED development for displays and other technologies.

Products  

 

Electronics

For the analysis of electronic circuitry and interfaces, the control of precious metals, transition and heavy metals usage and application, and advanced organic and inorganic materials used in electronics and integrated circuits.

Products  

 

Semiconductors

Offering a wide range of solutions for the characterization and understanding of materials and processes used in the manufacture of semiconductor devices.

Products  

 

Gate Dielectrics

Assisting in the characterization and development of thin film gate dielectric stacks that form the basis of new transistor development.

Products  

 

Thin Film Photoresist

Materials characterization technique for elemental, chemical and molecular characterization of surface contaminants and residues in photoresist applications.

Products  

 

NewsView more »

Crimefighter Microscopy and Spectroscopy packages and LEnS Library

The Thermo Scientific Crimefighter microscopy or spectroscopy packages streamline your laboratory protocol to achieve the ultimate balance of speed and data confidence. Powered by the new Thermo Scien...

Carbon Nanomaterials Analysis with Raman and XPS

Raman spectroscopy and X-ray photoelectron spectroscopy can be used to gain insight into graphene-based materials -- these two techniques can provide complementary information on a range of material p...

New ARL PERFORM'X XRF Spectrometer

The new Thermo Scientific ARL PERFORM'X WDXRF spectrometer for advanced materials characterization integrates bulk elemental analysis capabilities with mapping and small spot analysis

EventsView more »

Molecular Spectroscopy, Surface Analysis and Microanalysis Events

Join us at any of the tradeshows and conferences listed here to chat one-on-one with Application Specialists or Sales Rep in finding the right Thermo Scientific instrument for your analytical needs.

Meet us at 2012 GSA Annual Meeting

This year's GSA Annual Meeting will take place in Charloote, NC from November 4 - 7, 2012. Technical sessions have been proposed that cover the full range of geoscience research both in the US and abr...

Surface Analysis Webinars

Join us for 1 hour or less webinars on the hotest applications of XPS.

Items of InterestView more »

ARL ADVANT'X and ARL 4460 at ArcelorMittal Romania

Description of the reasons why ArcelorMittal Romania have decided to buy a Thermo Scientific* ARL 4460 OES metals analyzer and an ARL ADVANT’X WDXRF spectrometer.

uspgh-zcom-p2-leg6.fishersci.com:80