Microelectronics and Semiconductor
Aiding materials researchers and engineers involved in microelectronics in developing new solutions, improving processes, and reducing materials and production costs.
Today’s microelectronic and semiconductor devices represent some of the most complex materials problems. As the scale on which these devices are fabricated continues to diminish and the breadth of elements and compounds utilized continues to expand, the challenge they present to the materials engineer increases dramatically. No single analytical technique can be expected to comprehensively answer all the materials support questions that arise from this exciting industry. The diversity of the Thermo Scientific* materials characterization portfolio allows materials engineers in this industry to meet today’s challenges and to discover future fabrication opportunities.
Acids
Providing the detection power required for elemental quantification of trace metals in high purity mineral acids.
Hard Disk Drives
Reliable and precise coating thickness determination, multi-layer analysis, defect analysis and process control of materials used in hard disk drives.
Ammonia Solution
Offering elemental quantification of trace metals in high purity ammonia solution.
LCD
Enabling the elemental quantification of ultra-trace metals in liquid crystals for LCD displays, and microspectroscopies in analysis of materials and structural characterization of LCD displays.
Deposition
Facilitating the elemental quantification of trace metals in high purity semiconductor samples.
OLED
Techniques in the characterization and understanding of polymer based electronics that form the basis of OLED development for displays and other technologies.
Electronics
For the analysis of electronic circuitry and interfaces, the control of precious metals, transition and heavy metals usage and application, and advanced organic and inorganic materials used in electronics and integrated circuits.
Semiconductors
Offering a wide range of solutions for the characterization and understanding of materials and processes used in the manufacture of semiconductor devices.
Gate Dielectrics
Assisting in the characterization and development of thin film gate dielectric stacks that form the basis of new transistor development.
Thin Film Photoresist
Materials characterization technique for elemental, chemical and molecular characterization of surface contaminants and residues in photoresist applications.
From feature identification to thin film characterization, we have the range of products and services to meet the requirements of scientists and engineers involved with microelectronics research and development.
