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Precise and reliable analysis of traces and impurities in pure titanium and other metal bases used in medical implants.
Spark/Arc optical emission is considered to be the fastest and most sensitive technique to analyze traces in metallic and other conducting materials. In addition, the major and minor elements are also determined by XRF non-destructively.
XRF, Spark-OES
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ARL ADVANT'X and ARL 4460 at ArcelorMittal RomaniaDescription of the reasons why ArcelorMittal Romania have decided to buy a Thermo Scientific* ARL 4460 OES metals analyzer and an ARL ADVANT’X WDXRF spectrometer. |
