Hard Disk Drives

Reliable and precise coating thickness determination, multi-layer analysis, defect analysis and process control of materials used in hard disk drives.

For the determination of film thickness and multi-layer composition of substrate and magnetic materials, the characterization of read/write heads and magnetic media thin films, and particle and defect analysis, we offer a range of X-ray and photoelectron spectroscopies for the development and production of hard disk drives.

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Crimefighter Microscopy and Spectroscopy packages and LEnS Library

The Thermo Scientific Crimefighter microscopy or spectroscopy packages streamline your laboratory protocol to achieve the ultimate balance of speed and data confidence. Powered by the new Thermo Scien...

Carbon Nanomaterials Analysis with Raman and XPS

Raman spectroscopy and X-ray photoelectron spectroscopy can be used to gain insight into graphene-based materials -- these two techniques can provide complementary information on a range of material p...

New ARL PERFORM'X XRF Spectrometer

The new Thermo Scientific ARL PERFORM'X WDXRF spectrometer for advanced materials characterization integrates bulk elemental analysis capabilities with mapping and small spot analysis

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Molecular Spectroscopy, Surface Analysis and Microanalysis Events

Join us at any of the tradeshows and conferences listed here to chat one-on-one with Application Specialists or Sales Rep in finding the right Thermo Scientific instrument for your analytical needs.

Meet us at 2012 GSA Annual Meeting

This year's GSA Annual Meeting will take place in Charloote, NC from November 4 - 7, 2012. Technical sessions have been proposed that cover the full range of geoscience research both in the US and abr...

Surface Analysis Webinars

Join us for 1 hour or less webinars on the hotest applications of XPS.

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