Surface Analysis Webinars

Upcoming Live Webinars

Characterizing New Graphene Devices with Raman and X-ray Photoelectron Spectroscopy

Thursday, March 21, 2013
Session 1 - 3 p.m. CET / 10 a.m. EDT / 14:00 GMT
Session 2 - 4 p.m. EDT / 1 p.m. PDT / 20:00 GMT

Good materials characterization is required across all steps in the creation of new graphene devices -- from guiding the initial graphene synthesis, transfer to the desired substrate, and understanding chemical modification and analysis of the finished device. Our webinar presentation shows how a multi-technique approach using both Raman spectroscopy and XPS can address the challenges posed at these steps.

Raman microscopy is well suited for the characterization of graphene. A vibrational spectroscopy, it is very sensitive to small changes in the geometric structure of a molecule and its environment. This sensitivity makes Raman an ideal probe for a number of important properties specific to graphene and nanotube samples, such as layer thickness, sample integrity and tube diameter.

X-ray photoelectron spectroscopy (XPS) is ideally suited to the determination of the surface chemistry and the way in which that chemistry changes in the surface and near-surface region. The technique provides quantitative elemental and chemical information with extremely high surface specificity and is ideal for comprehensively and quantitatively characterizing the elemental composition and chemical bonding states in graphene and carbon nanotubes.

Using both techniques in concert allows analysts to completely characterize carbon nanomaterials. Our webinar demonstrates the utility of these techniques, illustrated by examples from graphene samples created by mechanical exfoliation, chemical reduction and CVD methods.

Areas of Interest –

• Graphene Devices
• Transparent conductive electrode for microelectronics
• Thin film transistors
• Touch Screen Devices
• Graphene-based catalytic systems
• Molecular Sensors

On Demand Webinars

XPS Simplified - Analysis of Bio-surfaces using XPS

From investigating self-assembled monolayers, to bio-sensors and implants, surface analysis reveals critical information on both chemistry and conformity of materials that have been designed to mimic biological systems.

Discover how X-ray photoelectron spectroscopy can be used to investigate the surfaces of a variety of samples in the growing field of biomaterials. 

This webinar may interest those in:
• Medical Device Developers
• Biomedical and biotransport system engineers
• Chemical and Plastics Engineers
• Films and Packaging Engineers
• Research Biochemists

XPS Simplified with Ar Gas Cluster Ion Source for Soft Materials 

Gas cluster ion sources permit XPS depth profiling of soft materials without perturbing the chemistry of the remaining material enabling you to measure and analyze more materials that were previosuly difficult to characterize with a standard ion beam.

Learn from our XPS experts how:

• cluster depth profing works
• how depth profiling can be used to investigate a variety of samples from polymer-based electronics to novel coatings
• how a dual-mode source such as the Thermo Scientific* MAGCIS allows the investigation of mixed material samples

XPS Simplified - Polymer Surface Analysis 

X-ray photoelectron spectroscopy delivers chemical state information from the topmost few nanometers of the surface of a sample. Modern instruments, such as the Thermo Scientific K-Alpha* XPS system, can extend analyses into chemical images of the surface, revealing the extent of surface modification, or allowing defect detection. These strengths allow scientists and engineers to measure the effectiveness of coatings, understand plasma modification processes, and develop bio-compatibility coatings.

This webinar covers the basics of X-ray photoelectron spectroscopy, with a
special emphasis on how it can be used in the field of metal and oxide analysis.

The Power of XPS Imaging 

This webinar is an introduction to Parallel Imaging, and an overview of the benefits of using to investigate surface chemistry. Learn to identify surface chemistry from small features using the combination of the XPS technique and the Parallel Imaging hardware.

Complete Chemical Characterization and Failure Analysis of New Energy Materials using XPS and EDS 

Hosted by Materials Today Webinar

In this webinar, we describe, with examples how EDS and XPS can be used to characterize and perform failure analysis on modern energy materials.