Surface Analysis
Leading XPS spectrometer systems for materials science research, production and analytical laboratories.
Tackle the most challenging surface, thin film and interface questions with Thermo Scientific XPS spectrometers. Our analytical innovations allow scientists on the forefront of materials science to drive bold progress in the fields of ultra thin film and nanotechnology development. Unparalleled ease-of-use, best-in-class software and high sample throughput provide superior results for production and analytical laboratories. Whenever new questions rise to the surface, our comprehensive offering of XPS spectrometers deliver the performance and flexibility to arrive at a confident answer.
Avantage Data System
Thermo Scientific Avantage Data System for surface analysis integrates the functions of instrument control, data acquisition, data processing and reporting.
ESCALAB 250Xi
The Thermo Scientific ESCALAB 250Xi is an XPS spectrometer coupling high sensitivity with high resolution quantitative imaging and multi-technique capability.
K-Alpha
Thermo Scientific K-Alpha is a fully integrated, monochromated small-spot X-ray Photoelectron Spectrometer (XPS) system.
MultiLab 2000
Thermo Scientific MultiLab 2000 is a versatile surface analysis instrument that provides the analytical and sample treatment capabilities that most closely match user requirements.
Sigma Probe
Thermo Scientific Sigma Probe combines small spot XPS analysis with the ability to analyze multiple samples during unattended operation.
Surface Analysis Components
The Thermo Scientific range of Surface Analysis Components will enhance the capabilities of electron spectrometers and all benefit from one common data system, Avantage.
Theta 300
Thermo Scientific* Theta 300 is a wafer-handling tool that uses a combination of X-ray photoelectron spectroscopy (XPS) and angle resolved XPS to characterize surfaces and ultra-thin films with high precision.
Theta Probe
Thermo Scientific Theta Probe is a small spot XPS instrument which has the unique ability to collect angle resolved spectra without the need to tilt the sample, providing the capability to characterize ultra-thin layers non-destructively.
