Celestron* Flexible Bench Top TLP/VF-TLP Test System
The Thermo Scientific* Celestron flexible TLP/VF-TLP (Transmission Line Pulse) test system provides fast, accurate, and reliable characterization of advanced semiconductor structures.
A single system can be configured for TLP, VF-TLP for testing at either the wafer or the package level. Optional probes can be used to measure current and voltage on pins or pads other than the ones being stressed. Powerful software provides intuitive and comprehensive data analysis capabilities. Fast programming and execution bring accurate results quickly reducing product characterization cycles.