Process Monitoring and Industrial InstrumentsProcess Monitoring and Industrial Instruments ›  ESD, EMC and TLP Test SystemsESD, EMC and TLP Test Systems › Celestron* Flexible Bench Top TLP/VF-TLP Test System
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ThermoScientific
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Celestron* Flexible Bench Top TLP/VF-TLP Test System

The Thermo Scientific* Celestron flexible TLP/VF-TLP (Transmission Line Pulse) test system provides fast, accurate, and reliable characterization of advanced semiconductor structures.
A single system can be configured for TLP, VF-TLP for testing at either the wafer or the package level. Optional probes can be used to measure current and voltage on pins or pads other than the ones being stressed. Powerful software provides intuitive and comprehensive data analysis capabilities. Fast programming and execution bring accurate results quickly reducing product characterization cycles.
 
 
 
 
Part Number Description   Quantity
10133210 Test system; Bench top TLP/VF-TLP
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  • Wafer and package level TLP characterization
  • Integrated WINDOWS*-based system controller
  • TLP pulse generator
  • Integrated source/meter unit
  • Optional bias supplies (up to 5) under computer control for powered testing and measurements
  • Can be interfaced with semiautomatic probers
  • Advanced, intuitive software for control and report generation
  • Small bench top footprint
  • Single configuration available for both TLP and VF-TLP testing

 
 
 
 
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