NORAN System 7 X-ray Microanalysis System

• Identifies elemental peaks quickly and accurately using rule-based identification and peak shape deconvolution
• SpectraCheck both visually and statistically confirms the presence of an element using spectrum simulation and comparison routines—provides both an overlapped spectrum and a chi-squared value indicating goodness of fit
• Elemental peak references provide a complete set of spectral peak shapes collected with a typical EDS system
• The intensities from these shapes are automatically corrected to match the microscope detector—eliminates the need for periodic calibration of the system with standards
• Uses the PROZA Phi-Rho-Z matrix correction algorithm

Point and Shoot Mode

• Integrates electron imaging and X-ray analysis
• Single mouse click provides both elemental identification and quantitative analysis of the selected areas of interest of the sample
• Areas on the sample are defined using points, rectangles, circles, polygon or with a magic wand tool
• Magic wand tool allows easy, instant outline of complex areas without having to manually draw a border
• The selection, based on gray levels, is made automatically with just one click
• Selected areas may be analyzed instantly or multiple areas may be selected for automated analysis
• Performs processing according to chosen settings
• Able to provide the required spectral results—from qualitative analysis to quantitative analysis with full standards

Spectral Imaging

• Acquires a spectrum at every point—useful for imaging, X-ray mapping, Linescan and advanced automated analysis
• NORAN System 7 collects data that can be analyzed repeatedly without the need for reacquiring or changing acquisition parameters—with one click
• Analyze the collected data locally at the microscope or take the data offline to a different computer for report preparation

COMPASS

• Allows all of the people in the lab to perform the same analysis and obtain consistent results
• Uses powerful multivariate statistical algorithms, as created by Paul Kotula et al. and licensed from Sandia National Labs
• Using advanced algorithms, Direct-to-Phase extracts and displays known phases while the data is still being collected
• Allow the EDS system to decide when sufficient statistics have been collected, or visualize the data as it develops

Direct-to-Phase

• Data analysis concurrent with data collection - the speed of real time phase analysis
• Not only presents elemental data in maps and spectra, it develops an information-rich picture of the sample composition—and it produces complete data ten times faster than current X-ray microanalysis technology