The range of surface analysis components from Thermo Scientific includes a spherical sector electron energy analyzer, X-ray sources, ion sources and electron sources. These can be combined with the Avantage data system for full integration and advanced data processing capabilities.
Using Thermo Scientific components it is possible to configure surface analysis systems for the following types of measurement:- X-ray photoelectron spectroscopy (XPS)
- Monochromated XPS
- Angle resolved XPS
- Small area XPS
- Ultraviolet photoelectron spectroscopy (UPS)
- Auger electron spectroscopy (AES)
- Ion scattering spectroscopy (ISS)
- Composition depth profiling
These measurements are controlled by Avantage, the same data system that is used on our range of integrated surface analysis instruments.
Available Components
Alpha 110, Electron Energy Analyzer
- A compact, high-performance analyzer for surface analysis applications, featuring 180° geometry and multi-channel detection
- Offers a small area analysis and angle resolved XPS capability
- Mu-metal casing provides good magnetic shielding for high performance at low kinetic energy—there is no need for internal shielding
- Full computer control from the Avantage data system
- Also used on the MultiLab 2000 instrument
XR5, Monochromated X-ray Source
- The Thermo Scientific microfocused X-ray monochromator produces an X-ray beam with a very narrow energy spread
- The microfocusing capability of the XR5 provides maximum sensitivity combined with excellent energy resolution from selected areas, over a wide range of spot sizes
- Also used on our ESCALAB 250 and MultiLab 2000 instruments.
Key features include:
- 500mm Rowland circle
- Twin toroidal crystals
- Crystals aligned independently
- Spot size range 200µm to 650µm
- Moveable anode
- Focusing electron gun replaces filament as cathode
- Digital control using Avantage data system
XR3, Twin Anode X-ray Source
- The Thermo Scientific XR3 is a twin anode X-ray source
- The standard source is supplied with aluminum and magnesium anodes but other anode materials are available on request
Key features include:
- Standard anodes Al Ka (1486.6eV) and Mg Ka (1253.6eV)
- High power (400W for Al and 300W for Mg)
- Optional linear drive minimizes working distance and allows retraction for multi-technique flexibility
- Profiled nose piece helps avoid mechanical clashes
- Guaranteed <0.35% cross contamination of radiation
- Full computer control using the Avantage data system
UVL, Ultra-violet Light Source
- High intensity ultra-violet light source
- Suitable for UHV surface analysis applications, principally ultra-violet photoelectron spectroscopy (UPS)
- Produces an excellent He II:He I ratio
- The ratio of the valence band peak heights from He II (40.8eV) to He I (21.2eV) exceeds 1:1.8.
Key features include:
- High photon flux, 1.5 x 1012 photons per second
- Choice of light pipe lengths to optimize working distance
- Effective two-stage differential pumping (10-7 mbar typical chamber pressure)
- Air cooled
- Integral tilt mechanism for alignment
FEG 1000, High Resolution Field Emission Electron Gun
- High-resolution, scanned electron source intended for use on multi-technique surface analysis systems
- Applications include SEM imaging, Auger spectroscopy, multi-point Auger analysis, Auger mapping and Auger depth profiling
Key features include:
- Field emission source for maximum current density
- 95nm spot size at 5 nA
- Auger analysis at very high spatial resolution
- SEM and SAM imaging
- Controlled using Avantage, a Windows-based data system
FG01, Combination Low Energy Electron/Ion Gun
- A sophisticated and effective combination ion/electron gun—now available as a component
- A combination source that can deliver a beam of low energy electrons and a beam of low energy ions simultaneously
- Used very successfully on the Sigma Probe, Theta Probe and ESCALAB 250 instruments
EX05, Differentially Pumped, Scanning Ion Gun
- Designed for high-resolution depth profiles in both XPS and Auger
- Provides a high flux, small spot beam of noble gas ions at energies up to 5keV
- A negative potential can be applied to the drift tube in the EX05 column, this allows better performance at low energy to maximize depth resolution and to enable charge compensation for Auger
Key features include:
- Noble gas ions
- Differentially pumped
- Twin filament source
- Two lenses
- Floating drift tube
- Scannable
- Controlled using Avantage, a Windows-based data system
EX03, Ion Gun
- Intended mainly for sample cleaning prior to surface analysis
- Energy range up to 3 keV—delivers a broad spot ion beam with a large uniform section at its center to ensure uniform sample cleaning
- Maximum ion current exceeds 20µA
Thermo Scientific surface analysis instruments and components are controlled by the Avantage data system:
- Integrates all aspects of the analysis, including instrument control, data acquisition, data processing and reporting
- Windows based software package which allows remote control via a network and easy interfacing to third party software packages such as Microsoft Word
- Takes care of the total analysis process from sample to report
