WDS MagnaRay Spectrometer

• Unparalleled microanalysis results
• High resolution
• Sensitivity for trace elements
• Continuous spectrometer coverage for full spectral range
• Guaranteed sensitivity specification

Speed and Precision

• Revolutionary design with direct-drive mechanisms on both the diffracting crystals and counter allows the MagnaRay to change between elements as quickly as 0.25 seconds—enabling rapid analysis of multiple elements in the time that older WDS spectrometers are still moving to the first element
• Encoders coupled to the direct-drive system ensure angular precision of better than 0.001 degree—ensures WDS peaks always have the correct location

SEM and Low Voltage Applications

• X-ray optics extend into the SEM chamber, similar to a solid state EDS detector
• Ideal for applications where high sensitivity, light-element detection, overlapping peaks, high peak-to-background, or high spatial resolution are critical
• Provides high level of application performance under low beam current and low-voltage operating conditions

Sensitivity

• X-ray path design incorporates a focusing optic that transforms the divergent X-ray emission from the sample into an intense, focused parallel beam that then undergoes Bragg diffraction using one of the diffracting crystals
• Provides excellent count rates at both low and high energies using a propiretary hybrid X-ray focusing optic that incorporates both a polycapillary and grazing incidence optic
• Hybrid optic is joined by a single, low-energy capable, sealed Xenon proportional counter, simplifying design and operation and improving throughput for all elements as compared to older gas flow proportional counter designs

Nanoscale Analysis

• Superb peak-to-background ratios and extreme X-ray collection rates make WDS suitable for trace elemental analysis
• Operating conditions are dictated by the sample and the SEM—not the spectrometer
• Designed for the extreme operating conditions required for analysis of modern nanoscale materials—makes SEM-based nanoanalysis a reality
• Solves sample charging and sample damage problems commonly encountered with high-energy, high-current traditional WDS
• Ideal for samples where a small interaction volume is critical, such as nano-particles or thin films
• Incorporates the best features of WDS, without the detrimental requirements of high acceleration voltage or high beam current

• Helps in qualitative analysis of samples by assisting EDS when significant overlaps occur
• Automatically determine the presence or absence of elements such as Mo, S, Pb or Si, Ta, W, during the EDS aquisition, where overlaps are severe in the EDS spectrum

Quantitative Analysis

• Embedded expert system eliminates concerns regarding sample position, beam current and spectrometer setup
• Alignment of the spectrometer is handled automatically when it is needed
• The most appropriate element is chosen and the sample and spectrometer are aligned for optimum operation using information from the EDS spectrum
• Automated beam current measurements ensure accurate quantitative results

X-ray Maps and Linescans

• WDS technology provides inherently higher peak-to-background ratios than traditional EDS X-ray maps, producing X-ray maps and linescans with high contrast for low concentration materials
• Easy acquisition of WDS maps and linescans—select an elemental line in the periodic table of the NORAN System 7 software
• All of the spectrometer settings are automatically set to the best operating conditions possible for that line
• Complete transparent WDS integration within the NORAN System 7 software means that an EDS operator is already trained for WDS analyses