Sigma Probe

• High-performance XPS instrument with a large electron collection angle that ensures very high collection efficiency
• X-ray monochromator with user-selectable spot size in the range 15µm to 400µm
• Ability to handle large or multiple samples
• Controlled by Avantage, a Windows*-based data system
• CCD sample alignment microscope perpendicular to the sample surface

Lens, Analyzer, and Detector

• Photoelectrons are collected by an electrostatic lens having a large angular acceptance (60°)
• The 180° spherical sector analyser is fitted with a six-channel detector in the output plane, providing a very large, linear count rate range

X-ray Source

• All Sigma Probe instruments are fitted with a microfocusing monochromator
• Analysis area is selected by selecting the X-ray spot size in the range 15µm to 400µm

Depth Profiling

• The digitally controlled EX05 ion gun is a high-performance ion source that offers excellent depth profiles—even when using low energy ions
• Azimuthal rotation of the sample is available for greater depth profiling performance

Sample Handling

• All Sigma Probe instruments have a fully motorised stage capable of 5 axes of movement
• Stage can accommodate large samples—its movement range in X and Y is 70mm and 25mm in Z (height)

Vacuum System

The analysis chamber is constructed from 5 mm thick mu-metal to maximize the efficiency of the magnetic shielding

Sample Preparation

If required, the instrument may be fitted with a preparation chamber

Thermo Scientific surface analysis instruments and components are controlled by the Avantage data system:

• Integrates all aspects of the analysis, including instrument control, data acquisition, data processing and reporting
• Windows based software package which allows remote control via a network and easy interfacing to third party software packages such as Microsoft Word
• Takes care of the total analysis process from sample to report